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ISTQB CT-AI Exam Overview:

Certification Vendor:ISTQB
Exam Name:ISTQB Certified Tester - AI Testing Exam
Exam Number:CT-AI
Related Certifications:ISTQB Certified Tester Foundation Level (CTFL)
ISTQB Certified Tester Testing with Generative AI (CT-GenAI)
Exam Duration:60 (75 for non-native language)
Certificate Validity Period:Valid indefinitely (no expiration)
Exam Price:€180 - €250 (varies by region and provider)
Exam Format:1-2 points per question, Multiple-choice questions
Passing Score:65% (29/44 points for v2.0; 31/47 points for v1.0)
Available Languages:Portuguese, English, German, Korean, Chinese, Japanese, Spanish, French
Real Exam Qty:40
Recommended Training:ISTQB Accredited Training Providers
CT-AI Syllabus v2.0
Exam Registration:iSQI Exam Registration
ISTQB Official Registration
Pearson VUE
Sample Questions:ISTQB CT-AI Sample Questions
Exam Way:Online remote proctored / Onsite test center
Pre Condition:Must hold ISTQB Certified Tester Foundation Level (CTFL) certification
Official Syllabus URL:https://istqb.org/certifications/certified-tester-ai-testing-ct-ai/

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ISTQB CT-AI Prüfungsplan:

ThemaEinzelheiten
Thema 1
  • Neural Networks and Testing: This section of the exam covers defining the structure and function of a neural network including a DNN and the different coverage measures for neural networks.
Thema 2
  • Quality Characteristics for AI-Based Systems: This section covers topics covered how to explain the importance of flexibility and adaptability as characteristics of AI-based systems and describes the vitality of managing evolution for AI-based systems. It also covers how to recall the characteristics that make it difficult to use AI-based systems in safety-related applications.
Thema 3
  • Introduction to AI: This exam section covers topics such as the AI effect and how it influences the definition of AI. It covers how to distinguish between narrow AI, general AI, and super AI; moreover, the topics covered include describing how standards apply to AI-based systems.
Thema 4
  • systems from those required for conventional systems.
Thema 5
  • Using AI for Testing: In this section, the exam topics cover categorizing the AI technologies used in software testing.
Thema 6
  • Testing AI-Specific Quality Characteristics: In this section, the topics covered are about the challenges in testing created by the self-learning of AI-based systems.

ISTQB Certified Tester AI Testing Exam CT-AI Prüfungsfragen mit Lösungen (Q79-Q84):

79. Frage
In a conference on artificial intelligence (Al), a speaker made the statement, "The current implementation of Al using models which do NOT change by themselves is NOT true Al*. Based on your understanding of Al, is this above statement CORRECT or INCORRECT and why?
SELECT ONE OPTION

Antwort: D

Begründung:
* A. This statement is incorrect. Current AI is true AI and there is no reason to believe that this fact will change over time.
AI is an evolving field, and the definition of what constitutes AI can change as technology advances.
* B. This statement is correct. In general, what is considered AI today may change over time.
The term AI is dynamic and has evolved over the years. What is considered AI today might be viewed as standard computing in the future. Historically, as technologies become mainstream, they often cease to be considered "AI".
* C. This statement is incorrect. What is considered AI today will continue to be AI even as technology evolves and changes.
This perspective does not account for the historical evolution of the definition of AI . As new technologies emerge, the boundaries of AI shift.
* D. This statement is correct. In general, today the term AI is utilized incorrectly.
While some may argue this, it is not a universal truth. The term AI encompasses a broad range of technologies and applications, and its usage is generally consistent with current technological capabilities.


80. Frage
Which ONE of the following statements is a CORRECT adversarial example in the context of machine learning systems that are working on image classifiers.
SELECT ONE OPTION

Antwort: C

Begründung:
A . Black box attacks based on adversarial examples create an exact duplicate model of the original.
Black box attacks do not create an exact duplicate model. Instead, they exploit the model by querying it and using the outputs to craft adversarial examples without knowledge of the internal workings.
B . These attack examples cause a model to predict the correct class with slightly less accuracy even though they look like the original image.
Adversarial examples typically cause the model to predict the incorrect class rather than just reducing accuracy. These examples are designed to be visually indistinguishable from the original image but lead to incorrect classifications.
C . These attacks can't be prevented by retraining the model with these examples augmented to the training data.
This statement is incorrect because retraining the model with adversarial examples included in the training data can help the model learn to resist such attacks, a technique known as adversarial training.
D . These examples are model specific and are not likely to cause another model trained on the same task to fail.
Adversarial examples are often model-specific, meaning that they exploit the specific weaknesses of a particular model. While some adversarial examples might transfer between models, many are tailored to the specific model they were generated for and may not affect other models trained on the same task.
Therefore, the correct answer is D because adversarial examples are typically model-specific and may not cause another model trained on the same task to fail.


81. Frage
Which statement about using AI to analyze reported defects is MOST correct?

Antwort: B

Begründung:
The ISTQB CT-AI syllabus (Section5.3 - AI Support for Defect Analysis) explains that AI can categorize defect reports using natural language processing or classification models.
Categorization helps route defects efficiently and determine which areas of the system are affected. Thus, Option C is correct: AI canidentify defect categories, supporting assignment and triage.


82. Frage
Which AI-specific test objective and acceptance criterion should be selected MOST LIKELY for testing GPT_Legal?
Choose ONE option (1 out of 4)

Antwort: C

Begründung:
The ISTQB CT-AI syllabus introducesAI-specific quality characteristics, includingevolution,functional safety,compatibility, andbias-related data quality. Section5.1 - AI-Specific Test Objectivesexplains that evolutionrefers to an AI system's capability to continue improving or at least maintain performance as it undergoes additional training. GPT_Legal is explicitly described as aself-learning systemexpected to:
* continuously reduce false positives,
* achieve weekly accuracy improvements of 10%,
* reach and maintain 90% accuracy,
* adapt to new environments (patent law firm # corporate legal department).
This aligns perfectly with the syllabus definition ofevidence of evolution: ensuring the model doesnot degrade as additional training data is introduced. OptionBtherefore directly supports the described acceptance criteria for this evolving, self-learning application.
Option A (functional safety) is irrelevant because patent searching and drafting do not constitute safety- critical domains. Option C (compatibility) is necessary but not the primary AI-specific objective. Option D addresses bias, which is important but not central to the described performance and continuous-learning expectations.
Thus,Option Bis the most appropriate AI-specific test objective.


83. Frage
Which ONE of the following models BEST describes a way to model defect prediction by looking at the history of bugs in modules by using code quality metrics of modules of historical versions as input?
SELECT ONE OPTION

Antwort: A

Begründung:
Defect prediction models aim to identify parts of the software that are likely to contain defects by analyzing historical data and code quality metrics. The primary goal is to use this predictive information to allocate testing and maintenance resources effectively. Let's break down why option D is the correct choice:
Understanding Classification Models:
Classification models are a type of supervised learning algorithm used to categorize or classify data into predefined classes or labels. In the context of defect prediction, the classification model would classify parts of the code as either "defective" or "non-defective" based on the input features.
Input Data - Code Quality Metrics:
The input data for these classification models typically includes various code quality metrics such as cyclomatic complexity, lines of code, number of methods, depth of inheritance, coupling between objects, etc.
These metrics help the model learn patterns associated with defects.
Historical Data:
Historical versions of the code along with their defect records provide the labeled data needed for training the classification model. By analyzing this historical data, the model can learn which metrics are indicative of defects.
Why Option D is Correct:
Option D specifies using a classification model to predict the presence of defects by using code quality metrics as input data. This accurately describes the process of defect prediction using historical bug data and quality metrics.
Eliminating Other Options:
A). Identifying the relationship between developers and the modules developed by them: This does not directly involve predicting defects based on code quality metrics and historical data.
B). Search of similar code based on natural language processing: While useful for other purposes, this method does not describe defect prediction using classification models and code metrics.
C). Clustering of similar code modules to predict based on similarity: Clustering is an unsupervised learning technique and does not directly align with the supervised learning approach typically used in defect prediction models.
References:
ISTQB CT-AI Syllabus, Section 9.5, Metamorphic Testing (MT), describes various testing techniques including classification models for defect prediction.
"Using AI for Defect Prediction" (ISTQB CT-AI Syllabus, Section 11.5.1).


84. Frage
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