Echte und neueste CT-AI Fragen und Antworten der ISTQB CT-AI Zertifizierungsprüfung

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ISTQB CT-AI Prüfungsplan:

ThemaEinzelheiten
Thema 1
  • Testing AI-Specific Quality Characteristics: In this section, the topics covered are about the challenges in testing created by the self-learning of AI-based systems.
Thema 2
  • Quality Characteristics for AI-Based Systems: This section covers topics covered how to explain the importance of flexibility and adaptability as characteristics of AI-based systems and describes the vitality of managing evolution for AI-based systems. It also covers how to recall the characteristics that make it difficult to use AI-based systems in safety-related applications.
Thema 3
  • Using AI for Testing: In this section, the exam topics cover categorizing the AI technologies used in software testing.
Thema 4
  • systems from those required for conventional systems.
Thema 5
  • Machine Learning ML: This section includes the classification and regression as part of supervised learning, explaining the factors involved in the selection of ML algorithms, and demonstrating underfitting and overfitting.
Thema 6
  • Introduction to AI: This exam section covers topics such as the AI effect and how it influences the definition of AI. It covers how to distinguish between narrow AI, general AI, and super AI; moreover, the topics covered include describing how standards apply to AI-based systems.
Thema 7
  • Testing AI-Based Systems Overview: In this section, focus is given to how system specifications for AI-based systems can create challenges in testing and explain automation bias and how this affects testing.
Thema 8
  • Neural Networks and Testing: This section of the exam covers defining the structure and function of a neural network including a DNN and the different coverage measures for neural networks.

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ISTQB CT-AI Fragenkatalog, CT-AI Testking

Um Ihre Zertifizierungsprüfungen reibungslos erfolgreich zu meistern, brauchen Sie nur unsere Prüfungsfragen und Antworten zu ISTQB CT-AI (Certified Tester AI Testing Exam)auswendigzulernen. Viel Erfolg!

ISTQB Certified Tester AI Testing Exam CT-AI Prüfungsfragen mit Lösungen (Q111-Q116):

111. Frage
Which of the following statements about the structure and function of neural networks is true?
Choose ONE option (1 out of 4)

Antwort: D

Begründung:
Section1.7 - Neural Networksof the ISTQB CT-AI syllabus explains that neural networks consist of neurons connected by weighted links. During training,learning occurs by adjusting the weights on these connections.
This is the essence of gradient descent and backpropagation. Option B correctly states this behavior: only theweightsare modified, not the activation functions, neuron counts, or architectural structure.
Option A is incorrect because a neuron'sbiasis not determined by previous activations; it is an independent trainable parameter added to the weighted input sum. Option C is incorrect because the syllabus states that asingle-layer perceptron is a valid type of neural network, although limited to linearly separable problems.
Option D is incorrect because no rule requires the number of input neurons to exceed or equal the number of output neurons. Instead, input neurons correspond to thenumber of features, while output neurons correspond totasks or classes.
Therefore,Option Bprecisely reflects the syllabus definition of what changes during neural network training.


112. Frage
The stakeholders of a machine learning model have confirmed that they understand the objective and purpose of the model, and ensured that the proposed model aligns with their business priorities. They have also selected a framework and a machine learning model that they will be using. What should be the next step to progress along the machine learning workflow?

Antwort: B

Begründung:
The ML workflow typically involves iterative steps, beginning with data preparation once the model and framework are selected. The syllabus explains:
"The steps shown in Figure 1 (the ML workflow) do not include the integration of the ML model with the non-ML parts of the overall system. Typically, ML models cannot be deployed in isolation and need to be integrated with the non-ML parts... The next step would be data preparation as part of the ML workflow to provide input data to support training by an ML algorithm or prediction by an ML model."


113. Frage
A team of software testers is attempting to create an AI algorithm to assist in software testing. This particular team has gone through over 40 iterations of testing and cannot afford to spend as much time as it takes to run the full regression test suite. They are hoping to have the algorithm reduce the amount of testing required, thus reducing the time needed for each testing cycle.
How can an AI-based tool be expected to assist in this reduction?

Antwort: C

Begründung:
The syllabus mentions that AI can help optimize regression test suites:
"An AI-based tool can perform optimization of the regression test suite by analyzing... the information from previous test results, associated defects, and the latest changes that have been made, such as features which are broken more frequently and which tests exercise code impacted by recent changes." (Reference: ISTQB CT-AI Syllabus v1.0, Section 11.4, page 79 of 99)


114. Frage
Pairwise testing can be used in the context of self-driving cars for controlling an explosion in the number of combinations of parameters.
Which ONE of the following options is LEAST likely to be a reason for this incredible growth of parameters?
SELECT ONE OPTION

Antwort: A

Begründung:
Pairwise testing is used to handle the large number of combinations of parameters that can arise in complex systems like self-driving cars. The question asks which of the given options isleast likelyto be a reason for the explosion in the number of parameters.
* Different Road Types (A): Self-driving cars must operate on various road types, such as highways, city streets, rural roads, etc. Each road type can have different characteristics, requiring the car's system to adapt and handle different scenarios. Thus, this is a significant factor contributing to the growth of parameters.
* Different Weather Conditions (B): Weather conditions such as rain, snow, fog, and bright sunlight significantly affect the performance of self-driving cars. The car's sensors and algorithms must adapt to these varying conditions, which adds to the number of parameters that need to be considered.
* ML Model Metrics to Evaluate Functional Performance (C): While evaluating machine learning (ML) model performance is crucial, it does not directly contribute to the explosion of parameter combinations in the same way that road types, weather conditions, and car features do. Metrics are used to measure and assess performance but are not themselves variable conditions that the system must handle.
* Different Features like ADAS, Lane Change Assistance, etc. (D): Advanced Driver Assistance Systems (ADAS) and other features add complexity to self-driving cars. Each feature can have multiple settings and operational modes, contributing to the overall number of parameters.
Hence, theleast likelyreason for the incredible growth in the number of parameters isC. ML model metrics to evaluate the functional performance.
References:
* ISTQB CT-AI Syllabus Section 9.2 on Pairwise Testing discusses the application of this technique to manage the combinations of different variables in AI-based systems, including those used in self- driving cars.
* Sample Exam Questions document, Question #29 provides context for the explosion in parameter combinations in self-driving cars and highlights the use of pairwise testing as a method to manage this complexity.


115. Frage
Which ONE of the following models BEST describes a way to model defect prediction by looking at the history of bugs in modules by using code quality metrics of modules of historical versions as input?
SELECT ONE OPTION

Antwort: B

Begründung:
Defect prediction models aim to identify parts of the software that are likely to contain defects by analyzing historical data and code quality metrics. The primary goal is to use this predictive information to allocate testing and maintenance resources effectively. Let's break down why option D is the correct choice:
Understanding Classification Models:
Classification models are a type of supervised learning algorithm used to categorize or classify data into predefined classes or labels. In the context of defect prediction, the classification model would classify parts of the code as either "defective" or "non-defective" based on the input features.
Input Data - Code Quality Metrics:
The input data for these classification models typically includes various code quality metrics such as cyclomatic complexity, lines of code, number of methods, depth of inheritance, coupling between objects, etc.
These metrics help the model learn patterns associated with defects.
Historical Data:
Historical versions of the code along with their defect records provide the labeled data needed for training the classification model. By analyzing this historical data, the model can learn which metrics are indicative of defects.
Why Option D is Correct:
Option D specifies using a classification model to predict the presence of defects by using code quality metrics as input data. This accurately describes the process of defect prediction using historical bug data and quality metrics.
Eliminating Other Options:
A). Identifying the relationship between developers and the modules developed by them: This does not directly involve predicting defects based on code quality metrics and historical data.
B). Search of similar code based on natural language processing: While useful for other purposes, this method does not describe defect prediction using classification models and code metrics.
C). Clustering of similar code modules to predict based on similarity: Clustering is an unsupervised learning technique and does not directly align with the supervised learning approach typically used in defect prediction models.
References:
ISTQB CT-AI Syllabus, Section 9.5, Metamorphic Testing (MT), describes various testing techniques including classification models for defect prediction.
"Using AI for Defect Prediction" (ISTQB CT-AI Syllabus, Section 11.5.1).


116. Frage
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CT-AI Fragenkatalog: https://www.zertpruefung.de/CT-AI_exam.html

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